Pattern Recognition: Special Issue on Multi-instance Learning in Pattern Recogni
Special Issue on Multi-instance Learning in Pattern Recognition and VisionThe details of the SI, refer to http://www.journals.elsevier.com/pattern-recognition/call-for-papers/special-issue-on-multiple-instance-learning-in-pattern-recog/The topics of interest include, but are not limited to:Weakly-supervised object localization/common object discovery; MIL for object detection/tracking; MIL for image classification/annotation; New MIL algorithms; Graph-based MIL; MIL with deep learning;Key instance detection in MIL; Large-scale MIL; Multi-label multi-instance learning; Text/document classification with MIL; MIL for natural language processing;Submission deadline: May 1, 2016Guest editors:Dr. Jianxin Wu (wujx2001@gmail.com), Nanjing University, Nanjing, ChinaDr. Xiang Bai (xbai@hust.edu.cn), Huazhong University of Science and Technology, Wuhan, ChinaDr. Marco Loog (M.Loog@tudelft.nl), Delft University of Technology, The NetherlandsDr. Fabio Roli (roli@diee.unica.it), University of Cagliari, ItalyDr. Zhi-Hua Zhou (zhouzh@nju.edu.cn), Nanjing University, Nanjing, China
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